On The Effect Of Reflectance On Phasor Field Non-Line-Of-Sight Imaging

Non-line-of-sight (NLOS) imaging aims to visualize a occluded scene by exploiting its indirect reflections on visible surfaces. Previous methods approach this problem inverting the light transport on the hidden scene, but are limited to isolated, diffuse objects. Recently, the phasor fields framework has been introduced, transforming the NLOS setting into a virtual line-of-sight (LOS) one, thus lifting most of the assumptions about the hidden scene, including diffuse reflectance. In this work we analyse the effect of the hidden BRDFs on phasor field-based NLOS imaging. We empirically study the reconstruction of hidden scenes composed of objects with increasingly specular materials. Then, we evaluate the effect of capturing such scenes at different sampling resolutions, and establish connections between the effect of these two different dimensions on the obtained reconstructions. We hope our analysis help characterizing the imaging capabilities of this promising new NLOS framework, and foster new NLOS imaging modalities.