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  • SPS
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    Length: 00:09:10
09 Jun 2021

Few-shot learning aims to recognize unseen images of new classes with only a few training examples. While great progress has been made with deep learning technology, most metric-based works rely on the measurement based on global feature representation of images, which is sensitive to background factors due to the scarcity of training data. Given this, we propose a novel method that chooses representative local features to facilitate few-shot learning. Specifically, we propose a “task-specific guided” strategy to mine local features that are task-specific and discriminative. For each task, we first mine representative local features for labeled images by a loss guided mechanism. Then these local features are used to guide a classifier to mine representative local features for unlabeled images. In this way, task-specific representative local features can be selected for better classification. We empirically show our method can effectively alleviate the negative effect introduced by background factors. Extensive experiments on two few-shot benchmarks show the effectiveness of the proposed method.

Chairs:
Amit Roy-Chowdhury

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    Members: Free
    IEEE Members: $11.00
    Non-members: $15.00