Statistical Distance Metric Learning For Image Set Retrieval
Ting-Yao Hu, Alexander G Hauptmann
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Measuring similarity between two image sets is instrumental in many computer vision tasks. In most of the recent works, it is done by aggregating embedding features of an image as a fixed size vector, and calculating a metric in vector space (i.e. Euclidean distance). The embedding feature function can be learned by deep metric learning(DML) technique. However, methods relying on feature aggregation fail to capture the diversity and uncertainty within image sets. In this paper, we obviate the need of feature aggregation and propose a novel Statistical Distance Metric Learning(SDML) framework, which represents each image set as a probability distribution in embedding feature space, and compares two image sets by statistical distance between their distributions. Among all types of statistical distance, we choose Jeffrey's divergence, which can be obtained from two embedding feature sets by kNN based density estimator. We also design a statistical centroid loss to enhance the discriminative power of training process. SDML preserves the diversity within an image set, and the relation between two sets. We evaluate our proposed approach on gait recognition and multi-shot person re-id. The results show that SDML outperforms conventional DML, and also receives competitive/superior performance comparing to the previous state-of-the-arts.
Chairs:
Shashikant Patil