ACTIVE LEARNING FOR EFFICIENT FEW-SHOT CLASSIFICATION
Aymane Abdali (IMT Atlantique); Vincent Gripon (IMT Atlantique); Lucas Drumetz (IMT Atlantique); Bartosz Boguslawski (Schneider Electric)
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SPS
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We introduce the problem of Active Few-Shot Classification
(AFSC) where the objective is to classify a small, initially
unlabeled, dataset given a very restrained labeling budget.
This problem can be seen as a rival paradigm to classical
Transductive Few-Shot Classification (TFSC), as both these
approaches are applicable in similar conditions. We first propose a methodology that combines statistical inference, and an
original two-tier active learning strategy that fits well into this
framework. We then adapt several standard vision benchmarks
from the field of TFSC. Our experiments show the potential
benefits of AFSC can be substantial, with gains in average
weighted accuracy of up to 10% compared to state-of-the-art
TFSC methods for the same labeling budget. We believe this
new paradigm could lead to new developments and standards
in data-scarce learning settings.