Skip to main content
ieee top header menu
IEEE.org
IEEE Xplore Digital Library
IEEE Standards
IEEE Spectrum
More Sites
Anonymous user menu
Cart
Create Account
Sign In
Conferences
ICASSP
ICASSP 2024
ICASSP 2023
ICASSP 2022
ICASSP 2022 China
ICASSP 2021
ICASSP 2020
ICASSP Archive
ICIP
ICIP 2023
ICIP 2022
ICIP 2021
ICIP 2020
ICIP Archive
Other Conferences
CISA 2024
GlobalSIP
ISBI 2023
ISBI 2022
ISBI 2020
Education
Webinars
Webinars
ASI Webinars
BISP TC Webinars
IVMSP TC Webinars
SA TWG Webinars
SAM TC Webinars
SL TC AASP TC Webinars
SPS Content
Courses
Course Catalog
Machine Learning Courses
Tutorials
Other Resources
Chapters
Lectures
Seasonal Schools
Workshops
A - M
ASRU
CAMSAP
ICME 2020
IVMSP 2022
MLSP
MLSP 2022
MLSP 2021
MLSP 2020
MMSP 2020
N - Z
SAM 2020
SLT 2021
SPAWC 2020
SSP 2016
Other Topics
About SPS Resource Center
Access Resources
General SPS
Leave this field blank
Search
IEEE SPS Resource Center
SPS Home
hard-samples based margin (HSM)
Showing 1 - 1 of 1 resources. Too many results? Use the search filters to refine your search.
Leave this field blank
Go
Sort by
Newest
Newest
Oldest
Sort by: Relevance
Title (A-Z)
Title (Z-A)
11 Oct 2023
HARD SAMPLES BASED MARGIN LOSS FOR FACE VERIFICATION
SPS
Members:
Free
IEEE Members:
$11.00
Non-members:
$15.00
